Invention Grant
- Patent Title: Measurement device and measurement method
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Application No.: US15964269Application Date: 2018-04-27
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Publication No.: US10433366B2Publication Date: 2019-10-01
- Inventor: Takahiro Kasagi , Masahiro Aoyama , Custodio Jean-Elaine Garcia , Takashi Yanagimoto
- Applicant: ANRITSU CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: ANRITSU CORPORATION
- Current Assignee: ANRITSU CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Pearne & Gordon LLP
- Priority: JP2017-110980 20170605
- Main IPC: H04W84/12
- IPC: H04W84/12 ; H04W74/08 ; H04L1/18 ; H04L1/24 ; H04W24/06 ; H04L1/00

Abstract:
A measurement device 10 includes a reception unit 13b that receives a frame transmitted from a DUT 1, an MCS determination unit 17a that determines whether or not a received MCS index of a frame received by the reception unit 13b matches a predetermined MCS index for comparison, a transmission unit 13a that transmits a notification signal to the DUT when the MCS determination unit 17a determines that the received MCS index matches the MCS index for comparison, and does not transmit the notification signal to the DUT when the MCS determination unit 17a determines that the received MCS index does not match the MCS index for comparison, and a measurement unit 14 that measures data under measurement included in the frame in which it is determined that the received MCS index matches the MCS index for comparison.
Public/Granted literature
- US20180352606A1 MEASUREMENT DEVICE AND MEASUREMENT METHOD Public/Granted day:2018-12-06
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