- Patent Title: Unevenness evaluation method and unevenness evaluation apparatus
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Application No.: US16096264Application Date: 2017-03-16
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Publication No.: US10436637B2Publication Date: 2019-10-08
- Inventor: Hiroshi Murase
- Applicant: IIX INC.
- Applicant Address: JP Tokyo
- Assignee: IIX INC.
- Current Assignee: IIX INC.
- Current Assignee Address: JP Tokyo
- Agency: Alleman Hall Creasman & Tuttle LLP
- Priority: JP2016-091642 20160428
- International Application: PCT/JP2017/010556 WO 20170316
- International Announcement: WO2017/187827 WO 20171102
- Main IPC: G01J1/44
- IPC: G01J1/44 ; G01J1/42

Abstract:
Given that a plurality of visual transfer function curves for a display panel are provided for each of different ranges from the display panel, two-dimensional luminance distribution data of the display panel is filtered using a filter having visual frequency characteristics substantially passing through: a part where a recognition sensitivity increases as a spatial frequency increases in a short-range function curve, which among the plurality of visual transfer function curves is the closest to the display panel; a peak part of the short-range function curve; a peak part in a long-range function curve, which among the plurality of visual transfer function curves is the farthest from the display panel; and a part where the recognition sensitivity decreases as the spatial frequency increases in the long-range function curve. An evaluation value of luminance unevenness of the display panel is calculated on the basis of the filtered two-dimensional filtering data.
Public/Granted literature
- US20190137334A1 UNEVENNESS EVALUATION METHOD AND UNEVENNESS EVALUATION APPARATUS Public/Granted day:2019-05-09
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