Invention Grant
- Patent Title: Correcting pixel defects based on defect history in an image processing pipeline
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Application No.: US14845659Application Date: 2015-09-04
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Publication No.: US10440299B2Publication Date: 2019-10-08
- Inventor: Sheng Lin , D. Amnon Silverstein , David R. Pope , Suk Hwan Lim
- Applicant: Apple Inc.
- Applicant Address: US CA Cupertino
- Assignee: Apple Inc.
- Current Assignee: Apple Inc.
- Current Assignee Address: US CA Cupertino
- Agency: Meyertons, Hood, Kivlin, Kowert & Goetzel, P.C.
- Agent Robert C. Kowert
- Main IPC: H04N5/367
- IPC: H04N5/367 ; H04N5/217 ; H04N1/409 ; G06T5/00

Abstract:
An image signal processor may include a pixel defect correction component that tracks defect history for frames captured by an image sensor and applies the history when identifying and correcting defective pixels in a frame. The component maintains a defect pixel location table that includes a defect confidence value for pixels of the image sensor. The component identifies defective pixels in a frame, for example by comparing each pixel's value to the values of its neighbor pixels. If a pixel is detected as defective, its defect confidence value may be incremented. Otherwise, the value may be decremented. If a pixel's defect confidence value is over a defect confidence threshold, the pixel is considered defective and thus may be corrected. If a pixel's defect confidence value is under the threshold, the pixel is considered not defective and thus may not be corrected even if the pixel was detected as defective.
Public/Granted literature
- US20170070692A1 CORRECTING PIXEL DEFECTS BASED ON DEFECT HISTORY IN AN IMAGE PROCESSING PIPELINE Public/Granted day:2017-03-09
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