Invention Grant
- Patent Title: Multi-die inductors with coupled through-substrate via cores
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Application No.: US16007670Application Date: 2018-06-13
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Publication No.: US10446486B2Publication Date: 2019-10-15
- Inventor: Kyle K. Kirby
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Perkins Coie LLP
- Main IPC: H01L29/00
- IPC: H01L29/00 ; H01L23/522 ; H01L23/48 ; H01L25/065

Abstract:
A semiconductor device comprising first and second dies is provided. The first die includes a first through-substrate via (TSV) extending at least substantially through the first die and a first substantially helical conductor disposed around the first TSV. The second die includes a second TSV coupled to the first TSV and a second substantially helical conductor disposed around the second TSV. The first substantially helical conductor is configured to induce a change in a magnetic field in the first and second TSVs in response to a first changing current in the first substantially helical conductor, and the second substantially helical conductor is configured to have a second changing current induced therein in response to the change in the magnetic field in the second TSV.
Public/Granted literature
- US20180323146A1 MULTI-DIE INDUCTORS WITH COUPLED THROUGH-SUBSTRATE VIA CORES Public/Granted day:2018-11-08
Information query
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