- 专利标题: System and method for characterizing anatomical features
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申请号: US15633819申请日: 2017-06-27
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公开(公告)号: US10448915B2公开(公告)日: 2019-10-22
- 发明人: Bruno Kristiaan Bernard De Man , Jed Douglas Pack , Eri Haneda , Sathish Ramani , Jiang Hsieh , James Vradenburg Miller , Peter Michael Edic
- 申请人: General Electric Company
- 申请人地址: US NY Schenectady
- 专利权人: General Electric Company
- 当前专利权人: General Electric Company
- 当前专利权人地址: US NY Schenectady
- 主分类号: A61B6/00
- IPC分类号: A61B6/00 ; A61B6/03 ; G06T7/00 ; A61B5/055 ; A61B5/00
摘要:
A method for characterizing anatomical features includes receiving scanned data and image data corresponding to a subject. The scanned data comprises sinogram data. The method further includes identifying a first region in an image of the image data corresponding to a region of interest. The method also includes determining a second region in the scanned data. The second region corresponds to the first region. The method further includes identifying a sinogram trace corresponding to the region of interest. The sinogram trace comprises sinogram data present within the second region. The method includes determining a data feature of the subject based on the sinogram trace and a deep learning network. The method also includes determining a diagnostic condition corresponding to a medical condition of the subject based on the data feature.
公开/授权文献
- US20180368781A1 SYSTEM AND METHOD FOR CHARACTERIZING ANATOMICAL FEATURES 公开/授权日:2018-12-27
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