- 专利标题: Specific absorption rate adjustment of scan parameters
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申请号: US15455622申请日: 2017-03-10
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公开(公告)号: US10451689B2公开(公告)日: 2019-10-22
- 发明人: Kirstin Jattke , Maria Kröll
- 申请人: Kirstin Jattke , Maria Kröll
- 申请人地址: DE Erlangen
- 专利权人: Siemens Healthcare GmbH
- 当前专利权人: Siemens Healthcare GmbH
- 当前专利权人地址: DE Erlangen
- 代理机构: Lempia Summerfield Katz LLC
- 优先权: DE102016204164 20160314
- 主分类号: G01V3/00
- IPC分类号: G01V3/00 ; G01R33/28 ; G01R33/54
摘要:
A method is provided to prevent a permissible specific absorption rate being exceeded during a magnetic resonance examination and to an evaluation unit. The method includes a first provisioning unit providing a permissible SAR to an evaluation unit. A second provisioning unit, which may be identical to the first provisioning unit, provides a scan protocol for the magnetic resonance examination to the evaluation unit. The evaluation unit checks the scan protocol for the permissible SAR. If this check reveals that the permissible SAR is not adhered to, the scan protocol is modified. In this case, the modification of the scan protocol entails the amendment of at least one scan parameter of the scan protocol. The amendment of the at least one scan parameter is performed in dependence on at least one preference parameter.
公开/授权文献
- US20170261569A1 SPECIFIC ADSORPTION RATE ADJUSTMENT OF SCAN PARAMETERS 公开/授权日:2017-09-14
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