Invention Grant
- Patent Title: Abatement and strip process chamber in a dual loadlock configuration
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Application No.: US14002087Application Date: 2012-02-29
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Publication No.: US10453694B2Publication Date: 2019-10-22
- Inventor: Jared Ahmad Lee , Martin Jeffrey Salinas , Paul B. Reuter , Imad Yousif , Aniruddha Pal
- Applicant: Jared Ahmad Lee , Martin Jeffrey Salinas , Paul B. Reuter , Imad Yousif , Aniruddha Pal
- Applicant Address: US CA Santa Clara
- Assignee: APPLIED MATERIALS, INC.
- Current Assignee: APPLIED MATERIALS, INC.
- Current Assignee Address: US CA Santa Clara
- Agency: Patterson + Sheridan LLP
- International Application: PCT/US2012/027135 WO 20120229
- International Announcement: WO2012/118897 WO 20120907
- Main IPC: H01L21/67
- IPC: H01L21/67 ; H01L21/3065 ; H01J37/32 ; H01L21/02 ; H01L21/3213 ; H01L21/687

Abstract:
Embodiments of the present invention provide a dual load lock chamber capable of processing a substrate. In one embodiment, the dual load lock chamber includes a chamber body defining a first chamber volume and a second chamber volume isolated from one another. Each of the lower and second chamber volumes is selectively connectable to two processing environments through two openings configured for substrate transferring. The dual load lock chamber also includes a heated substrate support assembly disposed in the second chamber volume. The heated substrate support assembly is configured to support and heat a substrate thereon. The dual load lock chamber also includes a remote plasma source connected to the second chamber volume for supplying a plasma to the second chamber volume.
Public/Granted literature
- US20130337655A1 ABATEMENT AND STRIP PROCESS CHAMBER IN A DUAL LOADLOCK CONFIGURATION Public/Granted day:2013-12-19
Information query
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