Invention Grant
- Patent Title: Apparatus and method for detecting surface topography
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Application No.: US15802829Application Date: 2017-11-03
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Publication No.: US10456029B2Publication Date: 2019-10-29
- Inventor: Yoel Arieli , Yoel Cohen , Shlomi Epstein , Dror Arbel , Ra'anan Gefen
- Applicant: ADOM, Advanced Optical Technologies Ltd
- Applicant Address: IL Lod
- Assignee: ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Current Assignee: ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Current Assignee Address: IL Lod
- Agency: Workman Nydegger
- Main IPC: A61B3/14
- IPC: A61B3/14 ; A61B3/10 ; G01B9/02 ; G01B11/06 ; A61B3/00 ; A61B3/15 ; G01N21/27 ; G02B3/08 ; G01J3/00

Abstract:
Apparatus and methods are described, for detecting the surface topography of a portion of a curved surface of an object. A beam of light is directed toward the surface from a broad angle of incidence with respect to an optical axis of a camera. Light reflected from the surface is received by the camera, via a narrow-angle aperture. One or more darkened regions in the received light are detected, and the surface topography of portion of the surface is detected at least partially in response to the detected darkened regions. Other applications are also described.
Public/Granted literature
- US20180070813A1 Apparatus and Method for Detecting Surface Topography Public/Granted day:2018-03-15
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