- 专利标题: Method for quantifying the intrinsic dimensions of radiation sensors, particularly ionizing radiation sensors, and device for implementing same
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申请号: US15551193申请日: 2016-02-17
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公开(公告)号: US10466374B2公开(公告)日: 2019-11-05
- 发明人: Nicolas Saurel , Nicolas Guillot
- 申请人: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
- 申请人地址: FR Paris
- 专利权人: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERIGES ALTERNATIVES
- 当前专利权人: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERIGES ALTERNATIVES
- 当前专利权人地址: FR Paris
- 代理机构: Oblon, McClelland, Maier & Neustadt, L.L.P.
- 优先权: FR1551427 20150219
- 国际申请: PCT/EP2016/053319 WO 20160217
- 国际公布: WO2016/131852 WO 20160825
- 主分类号: G01T7/00
- IPC分类号: G01T7/00 ; H01L31/02 ; G01T1/36 ; H01L27/02
摘要:
A method for quantifying intrinsic dimensions of radiation sensors, particularly ionizing radiation sensors, and a device for implementing the method. The method for quantifying the intrinsic dimensions of a radiation sensor includes: defining and modeling the sensor using a schematic diagram of the sensor, determining via numerical computation and via experimental design theory elements that affect the sensor, measuring various specific spatial positions around the sensor, via a multi-frequency calibration source of the radiation, and designing, via experimental design theory, the elements that affect a response of the sensor.
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