Invention Grant
- Patent Title: Optometry apparatus and optometry program
-
Application No.: US15710202Application Date: 2017-09-20
-
Publication No.: US10470658B2Publication Date: 2019-11-12
- Inventor: Michihiro Takii , Noriji Kawai , Taeko Horino , Hisashi Ochi , Kazunori Shibata
- Applicant: NIDEK CO., LTD.
- Applicant Address: JP Gamagori, Aichi
- Assignee: NIDEK CO., LTD.
- Current Assignee: NIDEK CO., LTD.
- Current Assignee Address: JP Gamagori, Aichi
- Agency: Sughrue Mion, PLLC
- Priority: JP2016-184726 20160921; JP2016-184727 20160921
- Main IPC: A61B3/08
- IPC: A61B3/08 ; A61B3/10 ; A61B3/14 ; A61B3/02 ; A61B3/00 ; A61B3/18 ; A61B3/11

Abstract:
An optometry apparatus includes: an optical characteristic measurement device configured to measure an optical characteristic of right and left subject eyes in a both-eye opened state by projecting a visual target onto the subject eyes; an anterior ocular segment acquisition device configured to acquire anterior ocular segment images of the right and left subject eyes by the optical characteristic measurement device during the measurement of the optical characteristic of the subject eye in the both-eye opened state; and a controller configured to execute: an analysis instruction for performing analysis processing on the anterior ocular segment images acquired by the anterior ocular segment acquisition device to acquire both-eye opened state information; a determination instruction for determining whether the both-eye opened state information acquired by the analysis instruction is favorable or not, to acquire determination information; and an output instruction for outputting the determination information acquired by the determination instruction.
Public/Granted literature
- US20180078135A1 OPTOMETRY APPARATUS AND OPTOMETRY PROGRAM Public/Granted day:2018-03-22
Information query