An electronic device includes one or more integrated circuits, a debugging translation block, and a bus connected to the one or more integrated circuits and the debugging translation block, the bus configured to provide a connection to one or more external devices, wherein the debugging translation block is configured to receive debugging commands from a testing host device via the bus, convert the debugging commands into debugging input data, and provide the debugging input data to a debugging state machine of a first integrated circuit of the one or more integrated circuits.