Invention Grant
- Patent Title: X-ray backscatter inspection system
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Application No.: US15601155Application Date: 2017-05-22
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Publication No.: US10481113B2Publication Date: 2019-11-19
- Inventor: Anatoli Arodzero , Sergey V. Kutsaev , Vitaliy Ziskin
- Applicant: Radiabeam Technologies LLC
- Applicant Address: US CA Santa Monica
- Assignee: Radiabeam Technologies, LLC
- Current Assignee: Radiabeam Technologies, LLC
- Current Assignee Address: US CA Santa Monica
- Main IPC: G01N23/203
- IPC: G01N23/203

Abstract:
Apparatus and methods for Compton scattering radiography employing a variable energy X-ray source and a detector capable of detecting the temporal intensity profile of scattered X-ray pulses disposed on one side of an object to be imaged. Based on analysis of the measurement of the instantaneous intensity of the detected photons and the beam position relative to the object, an image is generated. Each voxel can be reconstructed to yield a measure of variation in the density of the material of the object.
Public/Granted literature
- US20170336526A1 X-Ray Backscatter Inspection System Public/Granted day:2017-11-23
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