- Patent Title: Reflectometry instrument and method for measuring macular pigment
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Application No.: US15887639Application Date: 2018-02-02
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Publication No.: US10506925B2Publication Date: 2019-12-17
- Inventor: Scott J. Huter , Kevin Martin Magrini , Edward Allen DeHoog , Jeff Alan Burke , Nathan Franklin Engel
- Applicant: ZeaVision, LLC
- Applicant Address: US MO Chesterfield
- Assignee: ZeaVision, LLC
- Current Assignee: ZeaVision, LLC
- Current Assignee Address: US MO Chesterfield
- Agency: Nixon Peabody LLP
- Main IPC: A61B3/12
- IPC: A61B3/12 ; G01J3/42 ; G01J3/02 ; A61B3/15 ; A61B3/00 ; A61B3/14 ; A61B3/10
Abstract:
A reflectometry instrument includes a light source for emitting an illumination beam that illuminates the macula. A portion of the illumination beam is reflected from the macula and forms a detection beam. The detection beam is indicative of macular pigment in the macula. The instrument also includes a first mirror for reflecting the illumination beam toward the macula and for reflecting the detection beam from the macula. The instrument is configured so that the illumination beam and the detection beam remain separated between the macula and the first mirror.
Public/Granted literature
- US20180242843A1 REFLECTOMETRY INSTRUMENT AND METHOD FOR MEASURING MACULAR PIGMENT Public/Granted day:2018-08-30
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