Invention Grant
- Patent Title: Three-dimensional measurement device
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Application No.: US15619557Application Date: 2017-06-12
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Publication No.: US10508902B2Publication Date: 2019-12-17
- Inventor: Jun Tabuchi , Takashi Nakatsukasa
- Applicant: Keyence Corporation
- Applicant Address: JP Osaka
- Assignee: Keyence Corporation
- Current Assignee: Keyence Corporation
- Current Assignee Address: JP Osaka
- Agency: Kilyk & Bowersox, P.L.L.C.
- Priority: JP2016-166267 20160826
- Main IPC: G01B11/25
- IPC: G01B11/25 ; G01B21/04

Abstract:
A three-dimensional measurement device which is capable of increasing the operability at the time of repeatedly performing dimension measurement for a plurality of measurement target objects having substantially the same shape is provided. There are included a template storage unit for storing, as a template, model three-dimensional shape data and an operation procedure of dimension measurement performed on the model three-dimensional shape image, and a positional relationship specification unit for specifying a relative positional relationship between the model three-dimensional shape data and measurement three-dimensional shape data. The geometric element extraction unit specifies a geometric element of a measurement three-dimensional shape based on the relative positional relationship and the template, and the dimension value calculation unit performs dimension measurement on the measurement three-dimensional shape based on the relative positional relationship and the template.
Public/Granted literature
- US20180058843A1 Three-Dimensional Measurement Device Public/Granted day:2018-03-01
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