Invention Grant
- Patent Title: Distributed analysis x-ray inspection methods and systems
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Application No.: US16248547Application Date: 2019-01-15
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Publication No.: US10509142B2Publication Date: 2019-12-17
- Inventor: Shehul Sailesh Parikh , Balamurugan Sankaranarayanan , Jeffrey Bryan Abel , Siva Kumar , Joseph Bendahan
- Applicant: Rapiscan Systems, Inc.
- Applicant Address: US CA Torrance
- Assignee: Rapiscan Systems, Inc.
- Current Assignee: Rapiscan Systems, Inc.
- Current Assignee Address: US CA Torrance
- Agency: Novel IP
- Main IPC: G01V5/00
- IPC: G01V5/00 ; G08B13/194 ; G06T7/00 ; G06Q10/08

Abstract:
The present specification discloses systems and methods for integrating manifest data for cargo and light vehicles with their X-ray images generated during scanning. Manifest data is automatically imported into the system for each shipment, and helps the security personnel to quickly determine the contents of cargo. In case of a mismatch between cargo contents shown by manifest data and the X-ray images, the cargo may be withheld for further inspection. In one embodiment, the process of analyzing the X-ray image of the cargo in conjunction with the manifest data is automated.
Public/Granted literature
- US20190162873A1 Distributed Analysis X-Ray Inspection Methods and Systems Public/Granted day:2019-05-30
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