Invention Grant
- Patent Title: Machine learning device, machine learning system, and machine learning method
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Application No.: US16050252Application Date: 2018-07-31
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Publication No.: US10532432B2Publication Date: 2020-01-14
- Inventor: Yoshitaka Kubo
- Applicant: FANUC CORPORATION
- Applicant Address: JP Yamanashi
- Assignee: Fanuc Corporation
- Current Assignee: Fanuc Corporation
- Current Assignee Address: JP Yamanashi
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP2017-163735 20170828
- Main IPC: G06K9/62
- IPC: G06K9/62 ; B23K26/70 ; G06T7/00 ; B23K31/00

Abstract:
Quality judgment on a laser beam intensity distribution is performed by taking an observation condition of the laser beam into consideration. A machine learning device includes: a state observing means that acquires data indicating an intensity distribution of a laser beam and data indicating a condition for observing the laser beam, performed to generate the data indicating the intensity distribution as input data; a label acquisition means that acquires an evaluation value related to judgment of the quality of the laser beam as a label; and a learning means that performs supervised learning using a pair of the input data acquired by the state observing means and the label acquired by the label acquisition means as training data to construct a learning model for judging the quality of the laser beam.
Public/Granted literature
- US10493566B2 Machine learning device, machine learning system, and machine learning method Public/Granted day:2019-12-03
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