发明授权
- 专利标题: Time base correction method for high accuracy sampling scope-based measurements
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申请号: US16249234申请日: 2019-01-16
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公开(公告)号: US10534018B1公开(公告)日: 2020-01-14
- 发明人: Anatoli B. Stein , Alexander Taratorin , Valeriy Serebryanskiy
- 申请人: Guzik Technical Enterprises
- 申请人地址: US CA Mountain View
- 专利权人: Guzik Technical Enterprises
- 当前专利权人: Guzik Technical Enterprises
- 当前专利权人地址: US CA Mountain View
- 代理机构: Burns & Levinson, LLP
- 代理商 Joseph M. Maraia
- 主分类号: G01D18/00
- IPC分类号: G01D18/00 ; G01D21/00 ; G01P21/00 ; G01R35/00 ; G01R13/02 ; H04B10/079
摘要:
A method and apparatus for resolving time base-generated errors from sampling scope-based measurements. Mutually synchronized repetitive waveform-to-be-analyzed signals (WAS) and repetitive sinusoidal reference signals (RS) are respectively applied to a first channel and a second channel of a sampling scope. A time base generator applies a sampling signal to the first and second channels. An average sine wave period Tav for k samples of RS is determined, followed by determination of phase error φk for each of the k samples, corresponding to phase differences between an ideal sine wave signal and the applied reference sinusoidal signal. Time base error values dk for k samples are calculated from dk=φk*Tav/2π. Error values dk correct time base errors in the sampling signal, and the WAS is re-sampled at sampling times adjusted by dk.
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