Invention Grant
- Patent Title: Multiple phase measurement device
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Application No.: US15697237Application Date: 2017-09-06
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Publication No.: US10534026B2Publication Date: 2020-01-14
- Inventor: Ronald Steuer , Peter Radda
- Applicant: Fluke Corporation
- Applicant Address: US WA Everett
- Assignee: FLUKE CORPORATION
- Current Assignee: FLUKE CORPORATION
- Current Assignee Address: US WA Everett
- Agency: Seed Intellectual Property Law Group LLP
- Main IPC: G01R25/00
- IPC: G01R25/00 ; G01R23/02

Abstract:
Systems and methods that measure electrical parameters of a multi-phase electrical system may utilize a multi-phase measurement device that includes a sensor subsystem that has a voltage sensor and a current sensor. Each of the voltage sensor and the current sensor may be a contact-type sensor or a “non-contact” sensor that does not require galvanic contact. In operation, a multi-phase measurement device may utilize the voltage sensor and the current sensor to sequentially obtain single phase measurements for each phase of a multi-phase electrical system. The measurements may be synchronized to obtain various multi-phase power parameters, such as various parameters relating to power, phase, voltage, current, etc. The multi-phase measurement device may be operative to automatically detect when an operator has positioned a sensor of the sensor subsystem proximate a conductor under test so the multi-phase measurement device can initiate detection of one or more electrical parameters in the conductor.
Public/Granted literature
- US20190072596A1 MULTIPLE PHASE MEASUREMENT DEVICE Public/Granted day:2019-03-07
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