发明授权
- 专利标题: Radiation detector to determine a depth of interaction and method of using the same
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申请号: US16002658申请日: 2018-06-07
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公开(公告)号: US10534095B2公开(公告)日: 2020-01-14
- 发明人: Kan Yang
- 申请人: SAINT-GOBAIN CERAMICS & PLASTICS, INC.
- 申请人地址: US MA Worcester
- 专利权人: SAINT-GOBAIN CERAMICS & PLASTICS, INC.
- 当前专利权人: SAINT-GOBAIN CERAMICS & PLASTICS, INC.
- 当前专利权人地址: US MA Worcester
- 代理机构: Abel Schillinger, LLP
- 代理商 Robert N. Young
- 主分类号: G01T1/20
- IPC分类号: G01T1/20 ; G01T1/202 ; G01T1/164 ; G01T1/208
摘要:
A radiation detector can include a logic element configured to determine a depth of interaction based on a decay time corresponding to a radiation event and a constituent concentration profile of a radiation-sensing member. In another aspect, a method of detecting radiation can include determining a depth of interaction based on a decay time corresponding to a radiation event and a constituent concentration profile of a radiation-sensing member. The radiation detector and method can be useful in applications where depth of interaction is significant. The radiation-sensing member may include a variety of different materials, and is particularly well suited for alkali metal halides.
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