- 专利标题: Fabrication of thin-film electronic devices with non-destructive wafer reuse
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申请号: US15101287申请日: 2014-12-02
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公开(公告)号: US10535685B2公开(公告)日: 2020-01-14
- 发明人: Stephen R. Forrest , Kyusang Lee
- 申请人: The Regents of the University of Michigan
- 申请人地址: US MI Ann Arbor
- 专利权人: THE REGENTS OF THE UNIVERSITY OF MICHIGAN
- 当前专利权人: THE REGENTS OF THE UNIVERSITY OF MICHIGAN
- 当前专利权人地址: US MI Ann Arbor
- 代理机构: Reising Ethington P.C.
- 国际申请: PCT/US2014/068197 WO 20141202
- 国际公布: WO2015/084868 WO 20150611
- 主分类号: H01L27/12
- IPC分类号: H01L27/12 ; H01L29/66 ; H01L33/00 ; H01L21/306 ; H01L21/02 ; H01L21/78
摘要:
Thin-film electronic devices such as LED devices and field effect transistor devices are fabricated using a non-destructive epitaxial lift-off technique that allows indefinite reuse of a growth substrate. The method includes providing an epitaxial protective layer on the growth substrate and a sacrificial release layer between the protective layer and an active device layer. After the device layer is released from the growth substrate, the protective layer is selectively etched to provide a newly exposed surface suitable for epitaxial growth of another device layer. The entire thickness of the growth substrate is preserved, enabling continued reuse. Inorganic thin-film device layers can be transferred to a flexible secondary substrate, enabling formation of curved inorganic optoelectronic devices.
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