- 专利标题: CMM probe path controller and method
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申请号: US14685780申请日: 2015-04-14
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公开(公告)号: US10545019B2公开(公告)日: 2020-01-28
- 发明人: Paul Racine , Scott Carlson
- 申请人: Hexagon Metrology, Inc.
- 申请人地址: US RI North Kingstown
- 专利权人: Hexagon Metrology, Inc.
- 当前专利权人: Hexagon Metrology, Inc.
- 当前专利权人地址: US RI North Kingstown
- 代理机构: Nutter McClennen & Fish LLP
- 主分类号: G01B21/00
- IPC分类号: G01B21/00
摘要:
A method and apparatus for measuring an object using a CMM receives nominal geometry data relating to the object, and produces a set-up path based on the received nominal geometry data. The method also conducts a set-up measurement of the object using a CMM probe. The CMM probe conducts the set-up measurement by following the set-up path, and the set-up measurement of the object produces scan path information. The method generates a scan path using the scan path information, and controls the CMM probe to conduct a fine measurement of the object by causing the CMM probe to move along the generated scan path.
公开/授权文献
- US20160305777A1 CMM PROBE PATH CONTROLLER AND METHOD 公开/授权日:2016-10-20
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