Invention Grant
- Patent Title: Deskew circuit for automated test systems
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Application No.: US15618923Application Date: 2017-06-09
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Publication No.: US10547294B2Publication Date: 2020-01-28
- Inventor: Andrew Nathan Mort , Christopher C. McQuilkin
- Applicant: Analog Devices, Inc.
- Applicant Address: US MA Norwood
- Assignee: Analog Devices, Inc.
- Current Assignee: Analog Devices, Inc.
- Current Assignee Address: US MA Norwood
- Agency: Schwegman Lundberg & Woessner, P.A.
- Main IPC: H03K5/14
- IPC: H03K5/14 ; H03K5/00

Abstract:
This disclosure is in the field of electronics and more specifically in the field of timing control electronics. In an example, a timing control system can include or use an array of circuit cells, and each cell can provide a signal delay using a fixed delay or interpolation. The interpolation can include, in one or more cells, using three timing signals with substantially different delays to create a delayed output signal. Linearity of the delayed output signal is thereby improved. In an example, an impedance transformation circuit can be applied to improve a bandwidth in one or more of the cells to thereby improve the bandwidth of the timing control system.
Public/Granted literature
- US20180358957A1 DESKEW CIRCUIT FOR AUTOMATED TEST SYSTEMS Public/Granted day:2018-12-13
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