Invention Grant
- Patent Title: Calibration method of image measuring device
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Application No.: US16161571Application Date: 2018-10-16
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Publication No.: US10551174B2Publication Date: 2020-02-04
- Inventor: Yasuhiro Takahama
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JP2017-201946 20171018
- Main IPC: G01B11/24
- IPC: G01B11/24 ; H04N5/225 ; G01B9/02

Abstract:
The present invention includes a preparatory step of providing a calibration work piece having a flat reflecting surface as a work piece, and arranging the reflecting surface to be parallel to a standard optical axis and orthogonal or parallel to pixel array directions of an image capture element; a rotation step of rotating a prism centered on the standard optical axis; a brightness detection step of detecting the brightness of an image captured by the image capture element at each of a plurality of rotation positions of the prism; and a positioning step of aligning the prism at a rotation position where the brightness detected by the brightness detection step is greatest.
Public/Granted literature
- US20190113333A1 CALIBRATION METHOD OF IMAGE MEASURING DEVICE Public/Granted day:2019-04-18
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