Invention Grant
- Patent Title: Sensing device for measuring a level of an analyte, method of fabrication thereof
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Application No.: US15577266Application Date: 2016-05-30
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Publication No.: US10551336B2Publication Date: 2020-02-04
- Inventor: Kok Leong Chang , Zi En Ooi , Jie Zhang
- Applicant: Agency for Science, Technology and Research
- Applicant Address: SG Singapore
- Assignee: Agency for Science, Technology and Research
- Current Assignee: Agency for Science, Technology and Research
- Current Assignee Address: SG Singapore
- Agency: Winstead PC
- Priority: SG10201504195W 20150528
- International Application: PCT/SG2016/050256 WO 20160530
- International Announcement: WO2016/190820 WO 20161201
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G01N27/12 ; G01N27/416

Abstract:
There is provided a sensing device for measuring a level of an analyte. The sensing device includes a sensing element configured to sense the analyte and produce an electrical output which is variable based on the level of the analyte sensed, a measurement circuit including a reference element for providing an electrical property, the measurement circuit being connected to the sensing element and configured to provide a measurement output signal based on the electrical property of the reference element and the electrical output of the sensing element, whereby the measurement output signal indicates the level of the analyte sensed with respect to the electrical property of the reference element. There is also provided a corresponding method of fabricating the sensing device.
Public/Granted literature
- US20180149608A1 SENSING DEVICE FOR MEASURING A LEVEL OF AN ANALYTE, METHOD OF FABRICATION THEREOF Public/Granted day:2018-05-31
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