- Patent Title: Method for simulating magnetic flux leakage based on loop current
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Application No.: US15681186Application Date: 2017-08-18
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Publication No.: US10551350B2Publication Date: 2020-02-04
- Inventor: Yuhua Cheng , Libing Bai , Yonggang Wang , Jie Zhang , Chun Yin , Shuai Shi , Xue Chen
- Applicant: UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA
- Applicant Address: CN Chengdu
- Assignee: UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA
- Current Assignee: UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA
- Current Assignee Address: CN Chengdu
- Agency: Oliff PLC
- Priority: CN201710344531 20170516
- Main IPC: G01N27/82
- IPC: G01N27/82 ; G06F17/50 ; G01N27/83

Abstract:
The present invention provides a method for simulating magnetic flux leakage based on loop current, the magnetic distribution of a single loop current is obtained by solid angle, then the magnetic field distribution of a semi-infinite solenoid is obtained based on the assumption of arrangement of loop currents in the magnetized specimen, and its equation is given; and the JA hysteresis model is introduced to obtain the distribution of quasi-static magnetic flux leakage field, on the basis of analyzing the relation between the distribution of a loop current on the surface of the defect and the excitation magnetic field, the distribution of quasi-static magnetic flux leakage field is obtained based on the semi-infinite solenoid.
Public/Granted literature
- US20180335403A1 METHOD FOR SIMULATING MAGNETIC FLUX LEAKAGE BASED ON LOOP CURRENT Public/Granted day:2018-11-22
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