Invention Grant
- Patent Title: Deep deformation network for object landmark localization
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Application No.: US15436199Application Date: 2017-02-17
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Publication No.: US10572777B2Publication Date: 2020-02-25
- Inventor: Xiang Yu , Feng Zhou , Manmohan Chandrakar
- Applicant: NEC Laboratories America, Inc.
- Applicant Address: JP
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP
- Agent Joseph Kolodka
- Main IPC: G06K9/62
- IPC: G06K9/62 ; G06K9/00 ; G06K9/46 ; G06T7/73 ; G06N3/04 ; G06T7/60 ; G06N3/08

Abstract:
A system and method are provided. The system includes a processor. The processor is configured to generate a response map for an image, using a four stage convolutional structure. The processor is further configured to generate a plurality of landmark points for the image based on the response map, using a shape basis neural network. The processor is additionally configured to generate an optimal shape for the image based on the plurality of landmark points for the image and the response map, using a point deformation neural network. A recognition system configured to identify the image based on the generated optimal shape to generate a recognition result of the image. The processor is also configured to operate a hardware-based machine based on the recognition result.
Public/Granted literature
- US20170262736A1 Deep Deformation Network for Object Landmark Localization Public/Granted day:2017-09-14
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