- 专利标题: Polarimeter for detecting polarization rotation
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申请号: US16146523申请日: 2018-09-28
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公开(公告)号: US10578492B2公开(公告)日: 2020-03-03
- 发明人: Duhyun Lee , Andrei Faraon , Ehsan Arbabi , Sadegh Faraji-Dana , Mahsa Seyedeh Kamali , Yu Horie , Chanwook Baik
- 申请人: SAMSUNG ELECTRONICS CO., LTD. , CALIFORNIA INSTITUTE OF TECHNOLOGY
- 申请人地址: KR Suwon-si US CA Pasadena
- 专利权人: SAMSUNG ELECTRONICS CO., LTD.,CALIFORNIA INSTITUTE OF TECHNOLOGY
- 当前专利权人: SAMSUNG ELECTRONICS CO., LTD.,CALIFORNIA INSTITUTE OF TECHNOLOGY
- 当前专利权人地址: KR Suwon-si US CA Pasadena
- 代理机构: Sughrue Mion, PLLC
- 优先权: KR10-2017-0154982 20171120
- 主分类号: G01J4/04
- IPC分类号: G01J4/04
摘要:
A polarimeter for measuring a polarization rotation caused by a measurement object is provided, the polarimeter including an optically active material. The polarimeter includes a light source unit for irradiating a measurement object with light having a specific polarization; an anisotropic meta surface element for splitting reaction light, obtained by reacting the light of the specific polarization irradiated by the light source unit with the measurement object, into first and second reaction light; and a detection unit for detecting the first and second reaction light separated by the anisotropic meta surface element according to polarization. The polarization rotation caused by the measurement object may be calculated by comparing detection signals of the first and second reaction light detected by the detection unit.
公开/授权文献
- US20190101448A1 POLARIMETER FOR DETECTING POLARIZATION ROTATION 公开/授权日:2019-04-04
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