Invention Grant
- Patent Title: Pressure measuring method and pressure measuring apparatus
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Application No.: US15482815Application Date: 2017-04-09
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Publication No.: US10578507B2Publication Date: 2020-03-03
- Inventor: Yu-Han Chen , Chih-Wei Huang , Chi-Chieh Liao , Wei-Chung Wang
- Applicant: PixArt Imaging Inc.
- Applicant Address: TW Hsin-Chu
- Assignee: PixArt Imaging Inc.
- Current Assignee: PixArt Imaging Inc.
- Current Assignee Address: TW Hsin-Chu
- Agent Winston Hsu
- Priority: TW105111402A 20160412; CN201710185891 20170324
- Main IPC: G01L9/12
- IPC: G01L9/12 ; G01L25/00 ; G01L1/14 ; G06F3/041 ; G06F3/044

Abstract:
A pressure measuring method, applied to a pressure measuring apparatus, comprising: measuring a first pressure sensing value of the pressure measuring apparatus, which corresponds to a first pressure in a test mode; measuring a second pressure sensing value of the pressure measuring apparatus, which corresponds to a second pressure in the test mode; generating a first corresponding function according to the first pressure, the second pressure, the first pressure sensing value and the second pressure sensing value; sensing a third pressure sensing value via the pressure measuring apparatus in a normal mode; and generating a third pressure according to the third pressure sensing value via the first corresponding function; wherein the pressure measuring apparatus operates at a first scan frequency. By this way, the pressure sensing value can be calibrated, to solve the issue that the pressure sensing values are affected by scan frequencies.
Public/Granted literature
- US20170292888A1 PRESSURE MEASURING METHOD AND PRESSURE MEASURING APPARATUS Public/Granted day:2017-10-12
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