An electrical contact for use in an integrated circuit testing apparatus having an elongated electrically conductive contact pin with a contact tip facing upwards at an inner end of the contact pin, a curved bottom surface that allows the contact pin to rock and slide from side to side during testing. An elongated compressible member with a “P-shaped” cross section, with a “vertical portion” which is the upper, curved part of the so-called letter “P” shape adapted to fit snugly within an upward-facing recess on a top part of the contact pin, and a “horizontal portion” which is the trunk or vertical line of the so-called letter “P” shape positions in between and in contact with a lower top surface of the contact pin and a socket roof.