Invention Grant
- Patent Title: Similarity measurement method and device
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Application No.: US15694559Application Date: 2017-09-01
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Publication No.: US10579703B2Publication Date: 2020-03-03
- Inventor: Zhenguo Li , Jiefeng Cheng , Wei Fan
- Applicant: HUAWEI TECHNOLOGIES CO., LTD.
- Applicant Address: CN Shenzhen
- Assignee: Huawei Technologies Co., Ltd.
- Current Assignee: Huawei Technologies Co., Ltd.
- Current Assignee Address: CN Shenzhen
- Agency: Leydig, Voit & Mayer, Ltd.
- Priority: CN201510093574 20150303
- Main IPC: G06F17/12
- IPC: G06F17/12 ; G06F16/951 ; G06F7/00 ; G06F17/16 ; G06F17/10 ; G06F16/903 ; G06F7/02 ; G06Q30/02

Abstract:
A similarity measurement method includes: obtaining a directional relationship between nodes in a network, and determining a transition matrix; calculating a constraint matrix according to the transition matrix and an obtained attenuation factor; constructing a system of linear equations, where a coefficient matrix of the system of linear equations is the constraint matrix, and a variable of the system of linear equations is a correction vector; solving the system of linear equations by means of iteration by using a Jacobi method, and determining the correction vector; and calculating similarities between the nodes according to the transition matrix, the attenuation factor, and a diagonal correction matrix that is generated according to the correction vector. In the method, the correction vector is determined by using the Jacobi method, and further the similarities between the nodes may be calculated.
Public/Granted literature
- US20170364478A1 SIMILARITY MEASUREMENT METHOD AND DEVICE Public/Granted day:2017-12-21
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