Invention Grant
- Patent Title: Security inspection apparatus and method
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Application No.: US15609012Application Date: 2017-05-31
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Publication No.: US10585052B2Publication Date: 2020-03-10
- Inventor: Zhiqiang Chen , Ziran Zhao , Jin Cui , Dong Lin , Bin Hu , Xianshun Tan , Hong Wang
- Applicant: NUCTECH COMPANY LIMITED
- Applicant Address: CN Beijing
- Assignee: NUCTECH COMPANY LIMITED
- Current Assignee: NUCTECH COMPANY LIMITED
- Current Assignee Address: CN Beijing
- Agency: Kilpatrick Townsend & Stockton LLP
- Priority: CN201610634086 20160805
- Main IPC: G01N23/00
- IPC: G01N23/00 ; G01N23/203 ; G01V5/00

Abstract:
The present disclosure proposes a security inspection apparatus and method, relates to the technical field of radiation, wherein the security inspection apparatus of the disclosure includes: radiation emitting device, back-scatter detector, size-distance detecting device, orientation adjusting device; the back-scatter detector located between the radiation emitting device and an inspected object; the size-distance detecting device located between the radiation emitting device and the inspected object, for detecting a size of the inspected object and/or a distance between the inspected object and the size-distance detecting device; and the orientation adjusting device adjusts orientation of the radiation emitting device according to the size of the inspected object and/or the distance from the inspected object.
Public/Granted literature
- US20180038808A1 SECURITY INSPECTION APPARATUS AND METHOD Public/Granted day:2018-02-08
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