Invention Grant
- Patent Title: Method and device for fault detection
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Application No.: US14996107Application Date: 2016-01-14
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Publication No.: US10585738B2Publication Date: 2020-03-10
- Inventor: Fabrice Marinet , Jean-Louis Modave , Gilles Van Assche , Ronny Van Keer
- Applicant: Proton World International N.V. , STMicroelectronics (Rousset) SAS
- Applicant Address: NL Amsterdam FR Rousset
- Assignee: PROTON WORLD INTERNATIONAL N.V.,STMICROELECTRONICS (ROUSSET) SAS
- Current Assignee: PROTON WORLD INTERNATIONAL N.V.,STMICROELECTRONICS (ROUSSET) SAS
- Current Assignee Address: NL Amsterdam FR Rousset
- Agency: Seed Intellectual Property Law Group LLP
- Priority: FR1161673 20111215
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/07 ; G06F21/55 ; G06F21/75

Abstract:
The disclosure concerns a method implemented by a processing device. The method includes performing a first execution by the processing device of a computing function based on one or more initial parameters stored in a first memory device. The execution of the computing function generates one or more modified values of at least one of the initial parameters, wherein during the first execution the one or more initial parameters are read from the first memory device and the one or more modified values are stored in a second memory device. The method also includes performing a second execution by the processing device of the computing function based on the one or more initial parameters stored in the first memory device.
Public/Granted literature
- US20160124796A1 METHOD AND DEVICE FOR FAULT DETECTION Public/Granted day:2016-05-05
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