Invention Grant
- Patent Title: Display condition analysis device, display condition analysis method, and program recording medium
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Application No.: US15124851Application Date: 2015-02-19
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Publication No.: US10586101B2Publication Date: 2020-03-10
- Inventor: Kyota Higa , Ruihan Bao , Takami Sato , Ryota Mase , Kota Iwamoto
- Applicant: NEC Corporation
- Applicant Address: JP Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.
- Priority: JP2014-049001 20140312
- International Application: PCT/JP2015/000775 WO 20150219
- International Announcement: WO2015/136847 WO 20150917
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06F16/583 ; G06Q30/06 ; G06Q10/08

Abstract:
Disclosed is a display condition analysis device which is capable of analyzing the display conditions of products. This display condition analysis device is provided with: a product recognition means for recognizing, from a display image taken of products on display, the products in the display image; and a display condition analysis means for analyzing, on the basis of the positions of the recognized products, the display conditions of the products on display.
Public/Granted literature
- US20170017840A1 DISPLAY CONDITION ANALYSIS DEVICE, DISPLAY CONDITION ANALYSIS METHOD, AND PROGRAM RECORDING MEDIUM Public/Granted day:2017-01-19
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