Invention Grant
- Patent Title: Image capturing attachment tool, work management method, system, comparison device, and program
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Application No.: US15561562Application Date: 2016-03-24
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Publication No.: US10592772B2Publication Date: 2020-03-17
- Inventor: Rui Ishiyama , Takayuki Abe , Kayato Sekiya
- Applicant: NEC CORPORATION
- Applicant Address: JP Minato-ku, Tokyo
- Assignee: NEC CORPORATION
- Current Assignee: NEC CORPORATION
- Current Assignee Address: JP Minato-ku, Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2015-066499 20150327
- International Application: PCT/JP2016/059452 WO 20160324
- International Announcement: WO2016/158690 WO 20161006
- Main IPC: B25B23/14
- IPC: B25B23/14 ; G06K9/46 ; G06K9/00 ; G06K9/32 ; B25B23/00 ; B25B13/46 ; G05B19/12 ; G05B19/406 ; G06K9/22 ; G06K9/24 ; G06K9/62 ; G06Q50/04 ; B25B13/00 ; B25B15/00
Abstract:
An attachment tool includes an image capturing unit configured to capture an image of a random pattern provided on a comparison region of a part; and an identification result-outputting unit configured to output a part identification result obtained by comparing an image characteristic of the captured image of the random pattern with a previously stored image characteristic of a random pattern of a part.
Public/Granted literature
- US20180089535A1 ATTACHMENT TOOL, WORK MANAGEMENT METHOD, SYSTEM, COMPARISON DEVICE, AND PROGRAM Public/Granted day:2018-03-29
Information query
