Invention Grant
- Patent Title: Dialing test method, dialing test system, and computing node
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Application No.: US15799297Application Date: 2017-10-31
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Publication No.: US10594586B2Publication Date: 2020-03-17
- Inventor: Zhengxian Zhang , Yingjun Tian , Yu Zhang
- Applicant: Huawei Technologies Co., Ltd.
- Applicant Address: CN Shenzhen
- Assignee: HUAWEI TECHNOLOGIES CO., LTD.
- Current Assignee: HUAWEI TECHNOLOGIES CO., LTD.
- Current Assignee Address: CN Shenzhen
- Agency: Conley Rose, P.C.
- Main IPC: G06F15/173
- IPC: G06F15/173 ; H04L12/26 ; H04L12/937 ; H04L29/12 ; H04L12/24 ; H04L12/931

Abstract:
A dialing test method, a dialing test system, and a computing node relate to the network field. In this method, a dialing test system respectively creates a two dialing test ports on two computing nodes, where both Internet Protocol (IP) addresses of the two dialing test ports are IP addresses of a dialing test network, and the dialing test network does not overlap a service network of a virtual machine (VM). The dialing test system separately deploys respective dialing test resources for the two dialing test ports, and the dialing test resources does not overlap a resource of the VM on the two computing nodes, and the dialing test system triggers a dialing test procedure such that a dialing test task is executed between the two dialing test ports using the dialing test resources.
Public/Granted literature
- US20180069778A1 Dialing Test Method, Dialing Test System, and Computing Node Public/Granted day:2018-03-08
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