Invention Grant
- Patent Title: Semiconductor device and method for fabricating the same
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Application No.: US16459337Application Date: 2019-07-01
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Publication No.: US10600806B2Publication Date: 2020-03-24
- Inventor: Sung Gil Kim , Seul Ye Kim , Hong Suk Kim , Jin Tae Noh , Ji Hoon Choi , Jae Young Ahn
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR
- Agency: Renaissance IP Law Group LLP
- Priority: KR10-2017-0085703 20170706
- Main IPC: H01L27/11582
- IPC: H01L27/11582 ; H01L23/532 ; H01L27/108 ; H01L23/00 ; H01L29/06 ; H01L25/065 ; H01L27/11565

Abstract:
A stack structure includes conductive layer patterns and interlayer insulating layer patterns alternately stacked on one another. A channel hole penetrates the stack structure. A dielectric layer is disposed on a sidewall of the channel hole. A channel layer is disposed on the dielectric layer and in the channel hole. A passivation layer is disposed on the channel layer and in the channel hole. The channel layer is interposed between the passivation layer and the dielectric layer. An air gap is surrounded by the passivation layer. A width of the air gap is larger than a width of the passivation layer.
Public/Granted literature
- US20190326321A1 SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME Public/Granted day:2019-10-24
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