Invention Grant
- Patent Title: Method and device for measuring a transition rate of a phase transition
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Application No.: US15364975Application Date: 2016-11-30
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Publication No.: US10605752B2Publication Date: 2020-03-31
- Inventor: Jin-Chen Liu
- Applicant: Jin-Chen Liu
- Agency: Flynn Thiel, P.C.
- Priority: DE102015120899 20151202
- Main IPC: G01K17/00
- IPC: G01K17/00 ; G01N25/02 ; H01L35/32 ; G01N25/48 ; G01N33/00 ; G01K7/02 ; G01L13/00 ; G01N15/08 ; A61B5/00 ; G01N33/36

Abstract:
A method and a device for measuring a transition rate between a first phase of a material and a second phase of the material wherein the material is solid or liquid in the first phase and gaseous in the second phase. A thermopile which includes a plurality of conductor transitions at an interface area between the first and second phases. The thermopile has a first portion which includes every second one of the conductor transitions, and a second portion that includes the remaining conductor transitions. In addition, the method includes measuring a thermoelectric voltage that is applied on the thermopile and that represents a temperature difference between the first and second portions of the thermopile.
Public/Granted literature
- US20170160216A1 METHOD AND DEVICE FOR MEASURING A TRANSITION RATE OF A PHASE TRANSITION Public/Granted day:2017-06-08
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