- Patent Title: Method of detecting and describing features from an intensity image
-
Application No.: US15618604Application Date: 2017-06-09
-
Publication No.: US10607350B2Publication Date: 2020-03-31
- Inventor: Daniel Kurz , Peter Meier
- Applicant: Apple Inc.
- Applicant Address: US CA Cupertino
- Assignee: Apple Inc.
- Current Assignee: Apple Inc.
- Current Assignee Address: US CA Cupertino
- Agency: Blank Rome LLP
- Main IPC: G06K9/42
- IPC: G06K9/42 ; G06K9/46 ; G06T7/514 ; G06T7/593 ; G06T7/73

Abstract:
The invention provides methods of detecting and describing features from an intensity image. In one of several aspects, the method comprises the steps of providing an intensity image captured by a capturing device, providing a method for determining a depth of at least one element in the intensity image, in a feature detection process detecting at least one feature in the intensity image, wherein the feature detection is performed by processing image intensity information of the intensity image at a scale which depends on the depth of at least one element in the intensity image, and providing a feature descriptor of the at least one detected feature. For example, the feature descriptor contains at least one first parameter based on information provided by the intensity image and at least one second parameter which is indicative of the scale.
Public/Granted literature
- US20170278258A1 Method Of Detecting And Describing Features From An Intensity Image Public/Granted day:2017-09-28
Information query