Invention Grant
- Patent Title: Structure evaluation system, structure evaluation apparatus, and structure evaluation method
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Application No.: US16455433Application Date: 2019-06-27
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Publication No.: US10648949B2Publication Date: 2020-05-12
- Inventor: Kazuo Watabe , Hidefumi Takamine , Tomoki Shiotani
- Applicant: Kabushiki Kaisha Toshiba , Kyoto University
- Applicant Address: JP Tokyo JP Kyoto-shi
- Assignee: Kabushiki Kaisha Toshiba,Kyoto University
- Current Assignee: Kabushiki Kaisha Toshiba,Kyoto University
- Current Assignee Address: JP Tokyo JP Kyoto-shi
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@34103184
- Main IPC: G01M5/00
- IPC: G01M5/00 ; G01N29/04 ; G01N29/44 ; G01N29/07 ; G01N29/24 ; G01N29/14

Abstract:
According to an embodiment, a structure evaluation system includes a plurality of sensors, a position locator, a velocity calculator, and an evaluator. The sensors detect an elastic wave generated from a structure. The position locator derives a wave source distribution of the elastic waves generated from the structure, on the basis of the elastic waves. The velocity calculator derives a propagation velocity of the elastic wave generated from the structure, on the basis of the elastic waves. The evaluator evaluates the soundness of the structure on the basis of the wave source distribution and the propagation velocity of the elastic waves.
Public/Granted literature
- US20190317051A1 STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND STRUCTURE EVALUATION METHOD Public/Granted day:2019-10-17
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