- 专利标题： Platform, systems, and methods for identifying property characteristics and property feature conditions through aerial imagery analysis
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申请号： US16733888申请日： 2020-01-03
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公开(公告)号： US10650285B1公开(公告)日： 2020-05-12
- 发明人: Takeshi Okazaki
- 申请人： Aon Benfield Inc.
- 申请人地址： US IL Chicago
- 专利权人： Aon Benfield Inc.
- 当前专利权人： Aon Benfield Inc.
- 当前专利权人地址： US IL Chicago
- 代理机构： Gardella Grace P.A.
- 主分类号： G06Q40/00
- IPC分类号： G06Q40/00 ; G06K9/62 ; G06K9/00 ; G06N20/20 ; G06T7/00 ; G06N3/08 ; G06K9/46
摘要：
In an illustrative embodiment, methods and systems for automatically categorizing a condition of a property characteristic may include obtaining aerial imagery of a geographic region including the property, identifying features of the aerial imagery corresponding to the property characteristic, analyzing the features to determine a property characteristic classification, and analyzing a region of the aerial imagery including the property characteristic to determine a condition classification.
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