发明授权
- 专利标题: Planar neural probe structure and its assembly structure for chronic implantation
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申请号: US15721217申请日: 2017-09-29
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公开(公告)号: US10653329B2公开(公告)日: 2020-05-19
- 发明人: Sang Rok Oh , Keehoon Kim , Sehyuk Yim , Yong Seok Ihn , Donghyun Hwang
- 申请人: KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY
- 申请人地址: KR Seoul
- 专利权人: KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY
- 当前专利权人: KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY
- 当前专利权人地址: KR Seoul
- 代理机构: Birch, Stewart, Kolasch & Birch, LLP
- 优先权: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@13b7ac69
- 主分类号: A61B5/04
- IPC分类号: A61B5/04 ; A61N1/05 ; A61B5/00
摘要:
A neural probe structure, which is fixed to a nerve to acquire an electrical signal from the nerve or apply electrical stimulation to the nerve, includes a body which is bent to enclose at least a part of circumference of the nerve, and a probe which extends longitudinally from the body and passes through the nerve, wherein the probe has electrodes. A neural probe assembly includes the neural probe structure, wherein the probe passes through the nerve and the body encloses at least a part of circumference of the nerve, so that the neural probe structure is fixed to the nerve.
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