Invention Grant
- Patent Title: Generation of an RF test signal for testing an RF receive circuit
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Application No.: US16212883Application Date: 2018-12-07
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Publication No.: US10673544B2Publication Date: 2020-06-02
- Inventor: Niels Christoffers , Vincenzo Fiore , Helmut Kollmann , Christian Rap , Jochen O. Schrattenecker , Peter Unterkircher , Christoph Wagner
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Harrity & Harrity, LLP
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@19d25207 com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@3b38c53f
- Main IPC: H04B17/20
- IPC: H04B17/20 ; H04B1/16 ; G01S7/40 ; H04B17/19 ; H04B17/00 ; H04B17/29 ; H04L27/12

Abstract:
The description is of a circuit which, according to one example embodiment, comprises the following: an input circuit node for receiving an RF oscillator signal; a test signal generator circuit, which comprises at least one modulator and which is embodied to generate an RF test signal by modulating the RF oscillator signal. Further, the circuit comprises at least one receive channel with a receiver circuit and a coupler, which is embodied to feed the RF test signal into the receiver circuit.
Public/Granted literature
- US20190181964A1 GENERATION OF AN RF TEST SIGNAL FOR TESTING AN RF RECEIVE CIRCUIT Public/Granted day:2019-06-13
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