Invention Grant
- Patent Title: System and method for mura detection on a display
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Application No.: US15909893Application Date: 2018-03-01
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Publication No.: US10681344B2Publication Date: 2020-06-09
- Inventor: Yiwei Zhang , Janghwan Lee
- Applicant: Samsung Display Co., Ltd.
- Applicant Address: KR Yongin-si
- Assignee: Samsung Display Co., Ltd.
- Current Assignee: Samsung Display Co., Ltd.
- Current Assignee Address: KR Yongin-si
- Agency: Lewis Roca Rothgerber Christie LLP
- Main IPC: G09G3/00
- IPC: G09G3/00 ; H04N17/04 ; G06T7/00

Abstract:
A system and method for white spot Mura defects on a display. The system is configured to pre-process an input images to generate a plurality of image patches. A feature vector is then extracted for each of the plurality of image patches. The feature vector includes at least one image moment feature and at least one texture feature. A machine learning classifier then determines the presence of a defect in each patch using the feature vector.
Public/Granted literature
- US20190191150A1 SYSTEM AND METHOD FOR MURA DETECTION ON A DISPLAY Public/Granted day:2019-06-20
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