Invention Grant
- Patent Title: Indicator inspection machine, inspection method, and inspection program
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Application No.: US16008160Application Date: 2018-06-14
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Publication No.: US10684109B2Publication Date: 2020-06-16
- Inventor: Masaoki Yamagata , Shiro Igasaki
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@45958882
- Main IPC: G01B3/22
- IPC: G01B3/22 ; G01B21/04

Abstract:
An indicator inspection machine inspects the accuracy of an indicator based on a value displayed by the indicator when a spindle changes position. The indicator inspection machine includes a measurement spindle provided so as to be freely raised and lowered in order to displace the spindle of the indicator; a contact point provided to a distalmost end of the measurement spindle, the contact point making contact with an indicator contact point provided to a distalmost end of the spindle of the indicator; a drive mechanism driving the measurement spindle; and a controller controlling the drive mechanism so as to bring the contact point into contact with the indicator contact point while changing a speed of the measurement spindle at a predetermined periodicity.
Public/Granted literature
- US20180364019A1 INDICATOR INSPECTION MACHINE, INSPECTION METHOD, AND INSPECTION PROGRAM Public/Granted day:2018-12-20
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