Invention Grant
- Patent Title: Device and method for measuring the diameter and/or the wall thickness of a strand
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Application No.: US15555640Application Date: 2016-02-26
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Publication No.: US10684119B2Publication Date: 2020-06-16
- Inventor: Harald Sikora
- Applicant: Sikora AG
- Applicant Address: DE Bremen
- Assignee: Sikora AG
- Current Assignee: Sikora AG
- Current Assignee Address: DE Bremen
- Agency: Young Basile Hanlon & MacFarlane, P.C.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@72a06163 com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@1ce0d5bb
- International Application: PCT/EP2016/054162 WO 20160226
- International Announcement: WO2016/139155 WO 20160909
- Main IPC: G01N21/3581
- IPC: G01N21/3581 ; G01B11/06 ; G01J5/10

Abstract:
A device for measuring the diameter and/or the wall thickness of a strand that has a substantially circular cross-section and is guided through the device by guide means in the direction of its longitudinal axis includes at least one transmitter for transmitting terahertz radiation, at least one radiation optical system that conducts the terahertz radiation to a strand guided by the device, at least one reflector for the terahertz radiation arranged opposite a transmitter and behind the strand in the radiation direction of the terahertz radiation, at least one receiver for receiving the terahertz radiation reflected at the strand and/or the reflector, and an evaluation apparatus that determines the diameter and/or the wall thickness of the strand using the measuring signals received by the at least one receiver. A corresponding method is also described.
Public/Granted literature
- US20180112973A1 Device and Method for Measuring the Diameter and/or the Wall Thickness of a Strand Public/Granted day:2018-04-26
Information query
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