Invention Grant
- Patent Title: Raman probe, Raman spectrum obtaining apparatus, and method of obtaining Raman spectrum and detecting distribution of target material using Raman probe
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Application No.: US16297153Application Date: 2019-03-08
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Publication No.: US10684226B2Publication Date: 2020-06-16
- Inventor: Ho Jun Chang , Woo Chang Lee
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@4f76a024 com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@b9b0987
- Main IPC: G01J3/44
- IPC: G01J3/44 ; G01N21/65

Abstract:
A Raman probe provided includes a light source part configured to emit light on a sample, and further configured to adjust at least one of an incident angle of the light, a position of an emission point of the light, and a focal point of the light source part, a light collector configured to collect Raman scattered light from the sample, and further configured to adjust a field of view of Raman measurement and a focal point of the light collector, and a photodetector configured to receive the collected Raman scattered light, wherein the light source part comprises a reflection mirror configured to rotate to adjust the position of the emission point of the light.
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