Invention Grant
- Patent Title: Analysis device provided with ion mobility separation part
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Application No.: US16078286Application Date: 2017-02-28
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Publication No.: US10684256B2Publication Date: 2020-06-16
- Inventor: Hiroyuki Satake , Kazushige Nishimura , Hideki Hasegawa , Masuyuki Sugiyama
- Applicant: Hitachi High-Technologies Corporation
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Tech Corporation
- Current Assignee: Hitachi High-Tech Corporation
- Current Assignee Address: JP Tokyo
- Agency: Crowell & Moring LLP
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@64637b45
- International Application: PCT/JP2017/007699 WO 20170228
- International Announcement: WO2017/150505 WO 20170908
- Main IPC: G01N27/00
- IPC: G01N27/00 ; G01N27/62 ; H01J49/00 ; H01J49/06 ; H01J49/16

Abstract:
In order to make an analyzer with an ion mobility separation part have high durability and robustness, the analyzer includes an ion source, an ion mobility separation part which includes a pair of facing electrodes to which a high frequency voltage and a DC voltage are applied, and a shielding electrode which is provided between the ion source and the ion mobility separation part and to which a DC voltage is applied, wherein the shielding electrode includes an ion flow path connecting an inlet from which ions from the ion source are introduced and an outlet from which the ions are discharged thereinside, and the ion flow path is bent so that the outlet is unable to be seen from the inlet.
Public/Granted literature
- US20190079051A1 Analysis Device Provided with Ion Mobility Separation Part Public/Granted day:2019-03-14
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