- 专利标题: Automated measurement based on deep learning
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申请号: US16016776申请日: 2018-06-25
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公开(公告)号: US10685438B2公开(公告)日: 2020-06-16
- 发明人: Fitsum Aklilu Reda , Yiqiang Zhan , Parmeet Singh Bhatia , Yoshihisa Shinagawa , Luca Bogoni , Xiang Sean Zhou
- 申请人: Siemens Healthcare GmbH
- 申请人地址: DE Erlangen
- 专利权人: Siemens Healthcare GmbH
- 当前专利权人: Siemens Healthcare GmbH
- 当前专利权人地址: DE Erlangen
- 主分类号: G06K9/00
- IPC分类号: G06K9/00 ; G06T7/00 ; G01B21/20 ; G06T7/12 ; G06T7/60 ; G06T7/66 ; G06N20/00 ; G06K9/62 ; G06T7/62 ; G06K9/46
摘要:
A framework for automated measurement. In accordance with one aspect, the framework detects a centerline point of a structure of interest in an image. A centerline of the structure of interest may be traced based on the detected centerline point. A trained segmentation learning structure may be used to generate one or more contours of the structure of interest along the centerline. One or more measurements may then be extracted from the one or more contours.
公开/授权文献
- US20190019287A1 AUTOMATED MEASUREMENT BASED ON DEEP LEARNING 公开/授权日:2019-01-17
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