Invention Grant
- Patent Title: Method and apparatus for enhancing SE detection in mirror-based light imaging charged particle microscopes
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Application No.: US16229936Application Date: 2018-12-21
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Publication No.: US10692694B2Publication Date: 2020-06-23
- Inventor: Galen Gledhill , Mostafa Maazouz
- Applicant: Galen Gledhill , Mostafa Maazouz
- Applicant Address: US OR Hillsboro
- Assignee: FEI Company
- Current Assignee: FEI Company
- Current Assignee Address: US OR Hillsboro
- Agency: Klarquist Sparkman, LLP
- Main IPC: H01J37/00
- IPC: H01J37/00 ; H01J37/295 ; G02B21/00 ; H01J37/147 ; H01J37/12

Abstract:
Apparatus include a reflector positioned adjacent to a sample location that is situated to receive a charged particle beam (CPB) along a CPB axis from a CPB focusing assembly so that the reflector is situated to receive light emitted from a sample at the sample location based on a CPB-sample interaction or a photon-sample interaction and to direct the light to a photodetector, and a steering electrode situated adjacent to the reflector so as to direct secondary charged particles emitted from the sample based on the CPB-sample interaction away from the reflector and CPB axis. Methods and systems are also disclosed.
Public/Granted literature
- US20190198289A1 MIRROR-BASED LIGHT IMAGING CHARGED PARTICLE MICROSCOPES Public/Granted day:2019-06-27
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