Invention Grant
- Patent Title: Method and apparatus for measuring fine particulate matters
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Application No.: US16001046Application Date: 2018-06-06
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Publication No.: US10695706B2Publication Date: 2020-06-30
- Inventor: Hyun Tae Cho , Chong Min Kyung , Han Jung Kim
- Applicant: CENTER FOR INTEGRATED SMART SENSORS FOUNDATION
- Applicant Address: KR Daejeon
- Assignee: CENTER FOR INTEGRATED SMART SENSORS FOUNDATION
- Current Assignee: CENTER FOR INTEGRATED SMART SENSORS FOUNDATION
- Current Assignee Address: KR Daejeon
- Agency: Bond Schoeneck & King, PLLC
- Agent George McGuire; David Nocilly
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@37b0fbaf
- Main IPC: B01D46/46
- IPC: B01D46/46 ; G01N21/94 ; B01D46/00 ; G01N15/06 ; B01D46/44 ; G01N15/00

Abstract:
An apparatus for measuring fine particulate matter to determine a time to replace each of a filter and an air quality sensor based on a concentration of a filtered fine particulate matter and a method thereof are provided. The apparatus for measuring fine particulate matter is applied to an air cleaner, a personal environment monitoring system (PEMS), a fine particulate matter module, or the like by sensing a target material, such as harmful gas, as well as particulate matter and fine particulate matter in the air and providing result information.
Public/Granted literature
- US20180353891A1 METHOD AND APPARATUS FOR MEASURING FINE PARTICULATE MATTERS Public/Granted day:2018-12-13
Information query
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